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ID A1002300
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タイトル Further study on coaxial-probe-based two-thickness-method for nondestructive and broadband measurement of complex EM-parameters of absorbing material
著者
(Chen, Chun-Ping)
(Xu, Deming)
馬, 哲旺 (Ma, Zhewang)
埼玉大学大学院理工学研究科数理電子情報部門 (Graduate School of Science and Engineering, Saitama University)
(Anada, Tetsuo)
[出版社版]
出版者 社団法人電子情報通信学会
日付
出版年: 2007 - 2007
作成日: 2008-5-13
更新日: 2008-5-13
上位タイトル
IEICE TRANSACTIONS ON ELECTRONICS Vol.E90C, No.9  (2007. 9) ,p.1763- 1769
識別番号
ISSN
09168524
抄録 Two-Thickness-Method (TTM) based on an open-ended coaxial probe was investigated with an emphasis on uncertainty analysis to perfect this technique. Uncertainty equations in differential forms are established for the simultaneous measurement of complex electromagnetic (EM) parameters in the systematical consideration of various error factors in measurement. Worst-case differential uncertainty equations were defined while the implicit partial derivation techniques were used to find the coefficients in formulation. The relations between the uncertainties and test sample's thicknesses were depicted via 3D figures, while the influence of the coaxial line's dimension on the measurement accuracy is also included based on the same analysis method. The comparisons between the measured errors and theoretical uncertainty prediction are given for several samples, which validate the effectiveness of our analysis.
キーワード
coaxial probe
two-thickness-method
absorbing material
EM-parameters
permittivity
permeability
uncertainty
注記 copyright(c)2007 IEICE許諾番号:07R130209 http://search.ieice.org/index.html
言語
eng
資源タイプ text
ジャンル Journal Article
Index
/ Public / 埼玉大学 / 理工学研究科
/ Public / 埼玉大学 / 理工学研究科 / 数理電子情報部門
/ Public / 主題別 / 工学 / 電気電子工学 / 電子デバイス・電子機器
/ Public / ジャンル別 / 学術雑誌論文(国内) / 電子情報通信学会
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